Seminar on Nanotechnology

Park Systems Image Award Certificate

The certificate of acknowledgement for UTHM’s excellent image for Park systems Worldwide AFM Imaging Contest.

Testimonial from Lit Herng HENG(Product Manager, Crest Group of Companies)

"Mohd Ubaidillah Mustafa’s AFM image (1um scan of nanosphere) has been selected as the third prize winner of Park Systems AFM Worldwide user image competition. The main prize winner was from Thailand using Phase Imaging and the second prize winner was from Germany.

Crest and myself would like to congratulate you on a superb job done. Please share this honour with all our colleagues and friends and encourage them to join for next years contest. All of you will have 1 year to prepare the best images. Images from the advanced modes, usually attract many votes (just a quick tip for all future participants).Thank you. Tahniah!!!"

Picture below shows the image has been selected as the third prize winner of Park Systems AFM Worldwide user image competition.

Figure 1

Figure 2

FESEM Training

Date: 20hb & 21hb Januari 2010 (Wednesday & Thursday)
Time: 9 am ~ 5pm
Place: Makmal Fabrikasi Mikroelektronik, Kompleks FKEE

download note: Note 1 [click here], Note 2[click here], Note 3[click here]

Journal Club Meeting

Venue : PPI room
Date : 6/10/2009
Time : 9.00a.m
Topic : Any Journal/ Arcticle which relate to our project/ research
Organizer : Dr. Mohd Arif Agam